AN-7514 - Single-Pulse Unclamped Inductive Switching: A Rating System
PDF) UIS Characterization of LOCOS-Based LDMOS Transistor Fabricated by 1 µm CMOS Process | Boualem Djezzar - Academia.edu
Unclamped Inductive Switching (UIS) test - YouTube
(PDF) Dynamics of power MOSFET switching under unclamped inductive loading conditions | Kevin Fischer - Academia.edu
Figure 2 from Small current unclamped inductive switching (UIS) to detect fabrication defect for mass-production phase IGBT | Semantic Scholar
Figure 2 from Boundary of power-MOSFET, unclamped inductive-switching (UIS), avalanche-current capability | Semantic Scholar
Avalanche Ruggedness of SiC MPS Diodes Under Repetitive Unclamped-Inductive- Switching Stress - Technical Articles
Unclamped Inductive Switching (UIL) | FocusedTest: Power Discrete Test Solutions
Avalanche behavior of power MOSFETs under different temperature conditions
Unclamped Inductive Switching (UIL) | FocusedTest: Power Discrete Test Solutions
Unclamped inductive switching (UIS) — ipTEST Ltd
Circuit for the unclamped inductive switching (UIS) test. | Download Scientific Diagram
Unclamped Inductive Switching (UIL) | FocusedTest: Power Discrete Test Solutions
Avalanche Ruggedness of SiC MPS Diodes Under Repetitive Unclamped-Inductive- Switching Stress - Technical Articles
Evaluating of the Avalanche Failure of Power MOSFETs using Atlas - Silvaco
ON Semiconductor Is Now
b) compares the unclamped inductive switching waveforms for the studied... | Download Scientific Diagram
UIS - "Unclamped Inductive Switching" by AcronymsAndSlang.com
AN1968: Unclamped Inductive Switching (UIS) Test and Rating Methodology
Benchmarking the robustness of Si and SiC MOSFETs: Unclamped inductive switching and short-circuit performance - ScienceDirect
Reliability investigation of repeated unclamped inductive switching in a diode-clamped SiC circuit breaker - ScienceDirect
Typical test setup for unclamped inductive switching. The DUT is in... | Download Scientific Diagram
Power MOSFET Avalanche Design Guidelines
Figure 1 from Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching ( UIS ) Stress Condition | Semantic Scholar
Dynamic avalanche behavior of power MOSFETs and IGBTs under unclamped inductive switching conditions
